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Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering Xiao Liu Softcover reprint of the original 1st ed. 2014 edition
Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering
Xiao Liu
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
123 pages, 21 black & white illustrations, 38 colour illustrations, 18 black & white tables, biograp
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 23 août 2016 |
| ISBN13 | 9783319375946 |
| Éditeurs | Springer International Publishing AG |
| Pages | 108 |
| Dimensions | 155 × 235 × 7 mm · 185 g |