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Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes Edmund G. Seebauer Softcover reprint of hardcover 1st ed. 2009 edition
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes
Edmund G. Seebauer
"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
298 pages, 30 black & white tables, biography
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 22 octobre 2010 |
| ISBN13 | 9781849968201 |
| Éditeurs | Springer London Ltd |
| Pages | 298 |
| Dimensions | 155 × 235 × 16 mm · 435 g |
| Langue et grammaire | Anglais |