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Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 2012 edition
Smita Krishnaswamy
Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 2012 edition
Smita Krishnaswamy
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.
124 pages, 24 black & white tables, biography
Médias | Livres Hardcover Book (Livre avec dos et couverture rigide) |
Validé | 21 septembre 2012 |
ISBN13 | 9789048196432 |
Éditeurs | Springer |
Pages | 124 |
Dimensions | 155 × 235 × 9 mm · 362 g |
Langue et grammaire | English |
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