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Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2009 edition
Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology
Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.
279 pages, 14 black & white tables, biography
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 22 novembre 2010 |
| ISBN13 | 9783642098703 |
| Éditeurs | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 224 |
| Dimensions | 150 × 220 × 10 mm · 429 g |
| Langue et grammaire | Allemand |
| Éditeur | Bhushan, Bharat |
| Éditeur | Fuchs, Harald |