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Noise Analysis and Measurement for Active Pixel Sensor Readout Methods: Both Current Mode and Voltage Mode Dali Wu
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Noise Analysis and Measurement for Active Pixel Sensor Readout Methods: Both Current Mode and Voltage Mode
Dali Wu
A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 5 juin 2011 |
| ISBN13 | 9783639361544 |
| Éditeurs | VDM Verlag Dr. Müller |
| Pages | 92 |
| Dimensions | 150 × 6 × 226 mm · 145 g |
| Langue et grammaire | Anglais |
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