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Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology 2008 edition
Applied Scanning Probe Methods IX: Characterization - NanoScience and Technology
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
447 pages, 189 black & white illustrations, 27 colour illustrations, 25 black & white tables
| Médias | Livres Hardcover Book (Livre avec dos et couverture rigide) |
| Validé | 11 janvier 2008 |
| ISBN13 | 9783540740827 |
| Éditeurs | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 387 |
| Dimensions | 165 × 243 × 21 mm · 725 g |
| Langue et grammaire | Allemand |
| Éditeur | Bhushan, Bharat |
| Éditeur | Fuchs, Harald |
| Éditeur | Tomitori, Masahiko |