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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques Sebastian Huhn 2021 edition
Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
Sebastian Huhn
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 20 avril 2022 |
| ISBN13 | 9783030692117 |
| Éditeurs | Springer Nature Switzerland AG |
| Pages | 164 |
| Dimensions | 150 × 220 × 10 mm · 296 g |
| Langue et grammaire | Allemand |