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Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems Amith Singhee
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems
Amith Singhee
This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community.
246 pages, biography
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 5 novembre 2012 |
| ISBN13 | 9781461426721 |
| Éditeurs | Springer-Verlag New York Inc. |
| Pages | 246 |
| Dimensions | 155 × 235 × 13 mm · 367 g |
| Langue et grammaire | Anglais |
| Éditeur | Rutenbar, Rob A. |
| Éditeur | Singhee, Amith |