Compton Profile Study of Technologically Important Materials - Vimal Vyas - Livres - LAP LAMBERT Academic Publishing - 9783659143557 - 12 juin 2012
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Compton Profile Study of Technologically Important Materials

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The book highlights on the study of Compton Scattering Technique for semiconductors and alloys. Its First chapter is dedicated to Introduction of the techniques and literature survey as well. The second chapter is dedicated to Experimental details of the Compton Spectrometer. Third chapter highlighted the Compton Profile study of semiconducting material ZnSe, then fourth chapter is dedicated to electronic structure study of semiconducting materials AlN. The fifth chapter is devoted to Compton profile study of single crystalline Cu-Zn alloys for both alpha and beta phase in three principal directions. finally, last chapter is dedicated to conclusions and future scope. Overall, the book is well managed in view of science and knowledge. This book is very useful for young researchers in the filed of Condensed Matter Physics.

Médias Livres     Paperback Book   (Livre avec couverture souple et dos collé)
Validé 12 juin 2012
ISBN13 9783659143557
Éditeurs LAP LAMBERT Academic Publishing
Pages 160
Dimensions 150 × 9 × 226 mm   ·   256 g
Langue et grammaire Allemand