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Electrical Atomic Force Microscopy for Nanoelectronics 1st ed. 2019 edition
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Electrical Atomic Force Microscopy for Nanoelectronics
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.
| Médias | Livres Book |
| Validé | 24 août 2019 |
| ISBN13 | 9783030156114 |
| Éditeurs | Springer Nature Switzerland AG |
| Pages | 408 |
| Dimensions | 150 × 220 × 20 mm · 805 g |
| Langue et grammaire | Allemand |
| Éditeur | Celano, Umberto |
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