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Multi-run Memory Tests for Pattern Sensitive Faults Ireneusz Mrozek Softcover reprint of the original 1st ed. 2019 edition
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Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 1 février 2019 |
| ISBN13 | 9783030081980 |
| Éditeurs | Springer Nature Switzerland AG |
| Pages | 135 |
| Dimensions | 150 × 220 × 10 mm · 454 g |
| Langue et grammaire | Allemand |
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