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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Manoj Sachdev Softcover reprint of hardcover 2nd ed. 2007 edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing
Manoj Sachdev
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
328 pages, black & white illustrations
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 10 novembre 2010 |
| ISBN13 | 9781441942852 |
| Éditeurs | Springer-Verlag New York Inc. |
| Pages | 328 |
| Dimensions | 155 × 235 × 18 mm · 494 g |
| Langue et grammaire | Anglais |