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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology Adam Foster Softcover reprint of hardcover 1st ed. 2006 edition
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - NanoScience and Technology
Adam Foster
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
282 pages, biography
| Médias | Livres Paperback Book (Livre avec couverture souple et dos collé) |
| Validé | 23 novembre 2010 |
| ISBN13 | 9781441923066 |
| Éditeurs | Springer-Verlag New York Inc. |
| Pages | 282 |
| Dimensions | 155 × 235 × 16 mm · 417 g |
| Langue et grammaire | Anglais |
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